The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2018
Filed:
Oct. 28, 2014
Trustees of Boston University, Boston, MA (US);
Selim M. Unlu, Jamaica Plain, MA (US);
George Daaboul, Amesburg, MA (US);
Margo R. Monroe, Cambridge, MA (US);
Carlos Lopez, Brighton, MA (US);
Ahmet Tuysuzoglu, Brighton, MA (US);
Sunmin Ahn, La Jolla, CA (US);
TRUSTEES OF BOSTON UNIVERSITY, Boston, MA (US);
Abstract
Systems and methods for high-throughput processing of assay plates include a calibration nanoparticle to facilitate automated focusing of the imaging system. An assay plate includes a base layer, a transparent layer in contact with the base layer, and at least one calibration nanoparticle having a pre-defined size immobilized on the assay plate surface. The assay plate surface can be functionalized to selectively bind to biological targets. The assay plate can be used in an imaging system for high-throughput autofocus and biological target detection.