The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2018
Filed:
Mar. 19, 2018
Topcon Corporation, Tokyo, JP;
Mariko Kobayashi, Tokyo, JP;
TOPCON CORPORATION, Tokyo, JP;
Abstract
A lens meter includes a measurement optical system that projects measurement light to a test lens, and receives the measurement light which has passed through the test lens, a control part that calculates an optical characteristic value of the test lens based on the received measurement light, and controls the measurement optical system, a display part that displays the optical characteristic value by control of the control part, and an imaging part that obtains a lens image of the test lens, wherein the control part generates a mapping image showing distribution of the optical characteristic value of the test lens based on the optical characteristic value and position information of a measurement position of the optical characteristic value, generates a superimposed image in which the mapping image is superimposed onto the lens image, and displays the superimposed image on the display part.