The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2018

Filed:

Feb. 09, 2017
Applicant:

Savannah River Nuclear Solutions, Llc, Aiken, SC (US);

Inventors:

Patrick E. O'Rourke, Martinez, GA (US);

Robert J. Lascola, NA, SC (US);

David Immel, Augusta, GA (US);

Edward A. Kyser, III, Aiken, SC (US);

Jean R. Plummer, Aiken, SC (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/42 (2006.01); G01J 3/10 (2006.01); G01N 21/31 (2006.01); G01J 3/427 (2006.01); G01J 3/02 (2006.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
G01J 3/42 (2013.01); G01J 3/0297 (2013.01); G01J 3/10 (2013.01); G01J 3/427 (2013.01); G01N 21/3103 (2013.01); G01J 2003/102 (2013.01); G01J 2003/284 (2013.01);
Abstract

Spectrophotometers and spectroscopy processes are described that can provide for in-line calibration at every spectral acquisition as well as for continuous response correction during sample processing. The spectrophotometers include multiple polychromatic light sources that include characteristic emission spectra for use as an internal wavelength drift calibration system that is independent of environmental factors. Correction functions provided by the internal calibration process can be applied continuously and across an entire sample spectrum. The intensity response of each spectrometer in a spectrophotometer can also be monitored and continuously corrected for stray light, dark current, readout noise, etc.


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