The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2018

Filed:

Sep. 20, 2016
Applicant:

Raytheon Company, Waltham, MA (US);

Inventors:

John F. Silny, Playa Vista, CA (US);

Bradley A. Flanders, Whittier, CA (US);

Assignee:

RAYTHEON COMPANY, Waltham, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/18 (2006.01); G01J 3/12 (2006.01);
U.S. Cl.
CPC ...
G01J 3/2823 (2013.01); G01J 3/18 (2013.01); G01J 3/2803 (2013.01); G01J 2003/1204 (2013.01); G01J 2003/1273 (2013.01); G01J 2003/2826 (2013.01);
Abstract

An imaging spectrometer and method are provided. In one example, the imaging spectrometer includes foreoptics positioned to receive electromagnetic radiation from a scene, a diffraction grating positioned to receive the electromagnetic radiation from the foreoptics and configured to disperse the electromagnetic radiation into a plurality of spectral bands, each spectral band corresponding to a diffraction grating order of the diffraction grating, and a single-band focal plane array configured to simultaneously receive from the diffraction grating overlapping spectra corresponding to at least two diffraction grating orders.


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