The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2018
Filed:
Oct. 31, 2017
Purdue Research Foundation, West Lafayette, IN (US);
Cagri Abdullah Savran, West Lafayette, IN (US);
Bin-Da Chan, West Lafayette, IN (US);
Kutay Icoz, Kayseri, TR;
Purdue Research Foundation, West Lafayette, IN (US);
Abstract
A device for weighing micro- and nano-sized particles. The device includes a base portion, an oscillator coupled to the base portion configured to vibrate the base portion, a first cantilevered beam coupled to the base portion at a proximal end and having a tip portion at a distal end, and a second cantilevered beam coupled to the base portion at a proximal end and having a tip portion at a distal end, each of the first and second cantilever beams further having a first plurality of fingers near the first tip portion inwardly pointing and a second plurality of fingers near the second tip portion inwardly pointing, respectively, such that the entirety of each cantilever beam is positioned in a side-by-side manner next to the entirety of the other forming substantially mirror images of one another, the first plurality of fingers interdigitating with the second plurality of fingers such that the first cantilevered beam and the second cantilevered beam can oscillate independent of each other, the interdigitating fingers separated by gaps that are configured to reflect light from the interdigitating fingers during oscillation of the first and second cantilevered beams to form a diffraction pattern.