The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2018
Filed:
Nov. 28, 2017
National Taiwan Ocean University, Keelung, TW;
National Taiwan Ocean University, Keelung, TW;
Abstract
A non-contact and optical measuring automation system includes a base, a rotating chuck to clamp a disk cam, a moving stage module and an optical measuring module. The moving stage module includes a first linear motion stage movably disposed on the base, a second linear motion stage movably disposed on the first linear motion stage, and a rotary motion stage rotatably disposed on the second linear motion stage. The optical measuring module disposed on the rotary motion stage includes a laser-emitting unit and an image-capturing unit. The laser-emitting unit projects a light beam onto a cam surface of the disk cam, and the image-capturing unit receives scattering light to capture a grayscale measuring image including a profile speckle pattern. A computer calculates a profile speckle characteristic value according to the grayscale measuring image and the surface roughness value according to the profile speckle characteristic value.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile