The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2018
Filed:
Sep. 01, 2015
At&t Intellectual Property I, L.p., Atlanta, GA (US);
Tsong-Ho Wu, Englishtown, NJ (US);
Wen-Jui Li, Bridgewater, NJ (US);
Shyhyann Lee, East Brunswick, NJ (US);
Li-Chuan Sun, Holmdel, NJ (US);
AT&T INTELLECTUAL PROPERTY I, L.P., Atlanta, GA (US);
Abstract
A service impact event analyzer is used to evaluate service assurance risk in cloud SDN networks. Using data fusion, an alarm subset dataset is generated from a raw trap dataset. Service impact events are identified in the subset dataset. The service impact events are categorized into service impacted event categories, and a model is created for associating the event categories with process function classes. Time durations of the service impact events are computed using correlated secondary alarms from the alarm subset dataset. The service assurance risk is evaluated using the model and the time duration.