The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2018
Filed:
Mar. 16, 2016
Applicant:
SK Hynix Inc., Gyeonggi-do OT, KR;
Inventors:
Assignee:
SK Hynix Inc., Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); G06F 11/00 (2006.01); H03M 13/45 (2006.01); G06F 11/10 (2006.01); H03M 13/37 (2006.01); H03M 13/11 (2006.01); H03M 13/15 (2006.01); H03M 13/25 (2006.01); H03M 13/29 (2006.01);
U.S. Cl.
CPC ...
H03M 13/45 (2013.01); G06F 11/1004 (2013.01); G06F 11/1012 (2013.01); H03M 13/3723 (2013.01); H03M 13/6325 (2013.01); H03M 13/1111 (2013.01); H03M 13/152 (2013.01); H03M 13/1515 (2013.01); H03M 13/251 (2013.01); H03M 13/256 (2013.01); H03M 13/2957 (2013.01); H03M 13/2963 (2013.01);
Abstract
Methods for decoding information stored on a memory may include performing a hard read at an initial threshold and determining a first distribution percentage, performing a hard read at a subsequent threshold and determining a second distribution percentage, generating a log-likelihood ratio (LLR) based on the hard reads performed at the initial and subsequent thresholds, and based on the first and second distribution percentages, and soft decoding the information based on the generated LLR.