The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2018

Filed:

Mar. 31, 2016
Applicant:

Synaptics Incorporated, San Jose, CA (US);

Inventors:

Young Seen Lee, Newark, CA (US);

Paul Wickboldt, Walnut Creek, CA (US);

Patrick Smith, San Jose, CA (US);

Robert John Gove, Los Gatos, CA (US);

Jason Goodelle, San Jose, CA (US);

Assignee:

Synaptics Incorporated, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/146 (2006.01); G02B 27/30 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
H01L 27/14685 (2013.01); G02B 27/30 (2013.01); G06K 9/0004 (2013.01); H01L 27/14625 (2013.01); H01L 27/14632 (2013.01); H01L 27/14687 (2013.01);
Abstract

Methods and systems for integrating image sensor structures with collimator filters, including manufacturing methods and associated structures for forming collimator filters at the wafer level for integration with image sensor semiconductor wafers. Methods of making an optical biometric sensor include forming a collimator filter layer on an image sensor wafer, wherein a plurality of light collimating apertures in the collimator filter layer are aligned with a plurality of light sensing elements in the image sensor wafer, and after forming the collimator filter layer on the image sensor wafer, singulating the image sensor wafer into a plurality of individual optical sensors.


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