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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10147721 B1

PDFFull Text
Date of Patent:
Dec. 04, 2018

Filed:

Dec. 20, 2017

Method and apparatus for dynamic calibration of on-die-precision-resistors

Applicants:

Sridhar V. Gada, Bangalore, IN;

Sonu Arora, Princeton, NJ (US);

Inventors:

Sridhar V. Gada, Bangalore, IN;

Sonu Arora, Princeton, NJ (US);

Assignee:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

Attorney:

Timothy M. Honeycutt

Primary Examiner:

An Luu

Int. Cl.
CPC ...
H01L 27/02 (2006.01); H01L 27/06 (2006.01); H03H 11/28 (2006.01); H01L 23/34 (2006.01); H01L 49/02 (2006.01); H01L 21/8232 (2006.01); G11C 17/16 (2006.01); H03K 5/24 (2006.01); H01L 23/525 (2006.01);
U.S. Cl.
CPC ...
H01L 27/0629 (2013.01); H01L 21/8232 (2013.01); H01L 23/34 (2013.01); H01L 27/0211 (2013.01); H01L 28/20 (2013.01); H03H 11/28 (2013.01); G11C 17/165 (2013.01); H01L 23/5256 (2013.01); H03K 5/24 (2013.01);
Abstract

Various on-die-precision-resistor arrays, and methods of making and calibrating the same are disclosed. In one aspect, an apparatus is provided that includes a semiconductor chip and a precision resistor array on the semiconductor chip. A replica precision resistor array is on the semiconductor chip. The replica precision resistor array is configured to mimic the resistance behavior of the precision resistor array and has a characteristic resistance that is a function of temperature. The semiconductor chip is configured to calibrate the precision resistor array using the characterized resistance as a function of temperature, a resistance offset of the precision resistor array relative to the characterized resistance as a function of temperature, and a temperature of the precision resistor array.

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