The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2018

Filed:

Dec. 04, 2015
Applicant:

Denso Corporation, Kariya, Aichi-pref., JP;

Inventors:

Eiji Hayashi, Kariya, JP;

Wataru Kobayashi, Kariya, JP;

Eiji Nomura, Kariya, JP;

Kazuki Kouda, Kariya, JP;

Assignee:

DENSO CORPORATION, Kariya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/48 (2006.01); H01L 23/495 (2006.01); H01L 21/48 (2006.01); H01L 21/56 (2006.01); H01L 23/29 (2006.01); H01L 23/31 (2006.01); H01L 25/065 (2006.01); H01L 25/00 (2006.01); H01L 23/433 (2006.01); H01L 23/488 (2006.01);
U.S. Cl.
CPC ...
H01L 23/4952 (2013.01); H01L 21/4825 (2013.01); H01L 21/565 (2013.01); H01L 23/293 (2013.01); H01L 23/3107 (2013.01); H01L 23/3142 (2013.01); H01L 23/4334 (2013.01); H01L 23/488 (2013.01); H01L 23/49527 (2013.01); H01L 23/49562 (2013.01); H01L 23/49575 (2013.01); H01L 25/0655 (2013.01); H01L 25/50 (2013.01); H01L 2224/33 (2013.01); H01L 2924/181 (2013.01);
Abstract

A semiconductor device includes: a semiconductor chip having an electrode on one surface; a first conductive member disposed on one surface side of the semiconductor chip; a metal member having a base member and a membrane and disposed between the semiconductor chip and the first conductive member; a first solder disposed between the electrode of the semiconductor chip and the metal member; and a second solder disposed between the metal member and the first conductive member. The membrane has a metal thin film arranged on the surface of the base member and an uneven oxide film. The uneven oxide film is arranged on the metal thin film in at least a part of a connection region of a surface of the metal member, the connection region connecting a first connection region to which the first solder is connected and a second connection region to which the second solder is connected.


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