The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2018
Filed:
Nov. 23, 2016
Autodesk, Inc., San Rafael, CA (US);
Nandakumar Santhanam, Ithaca, NY (US);
Gordon Thomas Finnigan, Havard, MA (US);
Arpan Biswas, Canton, MI (US);
AUTODESK, INC, San Rafael, CA (US);
Abstract
A method and system provide the ability to modify a three-dimensional (3D) model in a shape editing system. The 3D model is obtained and faces of the model are selected as features (S). A subset (S') of the model that are fixed are selected. Shape modification operations to be performed are prescribed. A deformation lattice is constructed by setting up a lattice structure with control points. Parametric space (u,v,w) is defined in terms of vertices of the lattice structure. Euclidean space (x,y,z) of the 3D model is mapped to the parametric space (u,v,w). The deformation lattice is evaluated by selecting control points, and either affine transformations are applied directly to the selected control points, or the deformation lattice is deformed based on a discrete fitting problem. The evaluated deformed model is then output.