The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2018
Filed:
Apr. 27, 2015
Applicant:
Shinano Kenshi Co., Ltd., Nagano, JP;
Inventor:
Hiroaki Sugihara, Nagano, JP;
Assignee:
SHINANO KENSHI CO., LTD., Nagano, JP;
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/60 (2017.01); G01C 15/06 (2006.01); G01B 11/25 (2006.01); G01B 11/00 (2006.01); G06T 7/00 (2017.01); G06K 9/00 (2006.01); G01C 3/08 (2006.01); G06T 7/70 (2017.01); G06T 7/521 (2017.01);
U.S. Cl.
CPC ...
G06T 7/60 (2013.01); G01B 11/002 (2013.01); G01B 11/2504 (2013.01); G01B 11/2513 (2013.01); G01C 3/08 (2013.01); G01C 15/06 (2013.01); G06K 9/00496 (2013.01); G06T 7/521 (2017.01); G06T 7/70 (2017.01); G06T 2207/30244 (2013.01);
Abstract
Provided is a measurement device that is highly accurate due to an optical configuration. The following are provided: a pattern projector that projects an optical pattern; and a pattern image receiver that receives the optical pattern which was projected. The pattern image receiver includes: a pattern image pickup unit that picks up an image of the optical pattern and converts the same to image pickup data; and a point coordinate value calculation unit that, on the basis of the converted image pickup data, calculates a 3D coordinate value for the position of the image pickup unit or a position known from the image pickup unit.