The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2018
Filed:
Sep. 07, 2016
Applied Vision Corporation, Cuyahoga Falls, OH (US);
Richard A. Sones, Cleveland Heights, OH (US);
Craig A. Miller, Uniontown, OH (US);
APPLIED VISION CORPORATION, Cuyahoga Falls, OH (US);
Abstract
Described herein are various technologies pertaining to automated container inspection. A region in an image of a container is labeled as being subject to depicting reflections. When determining whether or not the container is defective based upon the image of the container, values of pixels of the image are compared to corresponding statistics of such pixels, where the statistics can identify an acceptable distribution of values for a pixel. For pixels in the above-mentioned region, more variance in the values of the pixels is allowed (compared to allowed variance when analyzing values of pixels outside of the region) when determining whether or not the container is defective based upon the values of the pixels.