The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2018

Filed:

Jan. 23, 2017
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Hirotaka Shiiyama, Yokohama, JP;

Masahiro Matsushita, Yokohama, JP;

Hideki Sorakado, Asaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06F 17/30 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6215 (2013.01); G06F 17/30047 (2013.01); G06F 17/30253 (2013.01); G06F 17/30256 (2013.01); G06K 9/4604 (2013.01); G06K 9/6211 (2013.01);
Abstract

There is provided with an image processing apparatus. An evaluation is set for each of the pairs. The evaluation is set based on at least one of the number of feature points in the first image where local feature amounts are similar to a local feature amount at one of the pair or the number of feature points in the second image where local feature amounts are similar to a local feature amount at one of the pair, in such a manner that the smaller the number of feature points, the higher the evaluation. A similarity between the first image and the second image is determined using a RANSAC method. A pair having a high evaluation is used with priority in derivation of a function for transforming coordinates using the RANSAC method.


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