The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2018
Filed:
Mar. 02, 2018
Recursion Pharmaceuticals, Inc., Salt Lake City, UT (US);
Mason L. Victors, Salt Lake City, UT (US);
Blake C. Borgeson, Salt Lake City, UT (US);
Cedric St-Jean-Leblanc, Montreal, CA;
Recursion Pharmaceuticals, Inc., Salt Lake City, UT (US);
Abstract
Systems and methods for determining whether a set of test perturbations discriminates over a null distribution for an on target effect against a first component of an entity are disclosed. The perturbations are perturbations of the first component and the entity comprises a plurality of components. For each perturbation in the set, a corresponding vector comprising a plurality of elements, is obtained. Each element comprises a distribution metric of measurements of a feature across instances of the entity upon exposure to the respective perturbation or (ii) a distribution metric of a respective dimension reduction component computed using the measurement of the plurality of features across instances of the entity upon the perturbation exposure. A composite metric is computed, using the vectors, and compared to a null distribution. When the composite metric is differentiated from the null distribution, the set of perturbations is deemed to discriminate the on target effect against the first component over the null distribution.