The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2018

Filed:

Aug. 23, 2016
Applicant:

Oracle International Corporation, Redwood City, CA (US);

Inventors:

David Rudy, Stoneham, MA (US);

George Kechriotis, Arlington, MA (US);

Patrick O'Grady, Chelmsford, MA (US);

James Gemmell, Ottawa, CA;

Assignee:

Oracle International Corporation, Redwood City, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/20 (2006.01); G11C 29/38 (2006.01); G11C 29/44 (2006.01); G11C 29/52 (2006.01);
U.S. Cl.
CPC ...
G06F 11/076 (2013.01); G06F 11/079 (2013.01); G06F 11/0727 (2013.01); G06F 11/0772 (2013.01); G06F 11/2069 (2013.01); G11C 29/38 (2013.01); G11C 29/44 (2013.01); G11C 29/52 (2013.01); G06F 2201/805 (2013.01);
Abstract

Utilities for use in actively detecting the occurrence of bad blocks in NAND flash storage devices and diagnosing the devices as faulty at some point before complete failure of the devices (e.g., before a number of allowable bad blocks has been reached) to allow a corresponding service processor to continue to write to available blocks for a period of time until a replacement NAND flash device can be identified. The utilities may also be utilized to predict the future occurrence of bad blocks in NAND flash devices, such as during the 'burn-in' process of the devices (e.g., which tests the quality of the NAND flash device before being placed into service to weed out devices with defects).


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