The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2018
Filed:
Jan. 12, 2017
Samsung Electronics Co., Ltd., Suwon-si, KR;
Karpinskyy Bohdan, Suwon-si, KR;
Yong-ki Lee, Yongin-si, KR;
Mi-jung Noh, Yongin-si, KR;
Sang-wook Park, Hwaseong-si, KR;
Kitak Kim, Yongin-si, KR;
Yong-Soo Kim, Osan-si, KR;
Yun-hyeok Choi, Hwaseong-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
An apparatus for testing a random number generator includes a correlation test circuit and a randomness determination circuit. The correlation test circuit extracts a first plurality of bit pairs each including two bits spaced apart from each other by a first distance in a bit stream generated by the random number generator, obtains a first sum of differences between respective two bits of the first plurality of bit pairs, and obtains a second sum of differences between respective two bits of a second plurality of bit pairs, the second plurality of bit pairs each including two bits spaced apart from each other by a second distance, different from the first distance, in the bit stream. The randomness determination circuit determines a randomness of the bit stream, based on the first sum and the second sum.