The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2018

Filed:

Jul. 03, 2013
Applicant:

Flextronics Ap, Llc, San Jose, CA (US);

Inventors:

Thomas K. Linton, Newnan, GA (US);

Gary Fong, Cupertino, CA (US);

Mark Whipple, Golden, CO (US);

Marni Berger, Belmont, CA (US);

Glenn Jones, Pleasanton, CA (US);

Assignee:

Flextronics AP, LLC, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01); G06N 5/02 (2006.01); G06Q 10/06 (2012.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G05B 19/418 (2013.01); G05B 19/41865 (2013.01); G06F 17/30389 (2013.01); G06N 5/02 (2013.01); G06Q 10/06315 (2013.01); Y02P 80/40 (2015.11);
Abstract

According to one embedment, a supply chain monitoring system can collect performance information from a server associated with each of a tier 1 control tower, tier 2 product assembler, tier 3 part and/or component manufacturer, and tier 4 material supplier to monitor a performance of one or more functions of a supply chain. The system obtains event information regarding an event potentially adversely impacting performance of the supply chain, determines a range of disruption of the event indicating a likely spatial range impacted by the event, and compares the range of disruption of the event against the supply chain to determine that a supply chain component has been impacted by the event.


Find Patent Forward Citations

Loading…