The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2018
Filed:
Mar. 09, 2016
Applicant:
Fujifilm Corporation, Tokyo, JP;
Inventors:
Assignee:
FUJIFILM CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G01N 15/00 (2006.01); G06K 9/00 (2006.01); G02B 21/36 (2006.01); G01N 21/27 (2006.01); G01N 15/14 (2006.01); H04N 7/18 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G01N 15/1475 (2013.01); G01N 21/27 (2013.01); G06K 9/00127 (2013.01); H04N 7/183 (2013.01); G01N 2015/1006 (2013.01);
Abstract
An image processing apparatus includes a detection-difficulty determination unit and a detection-parameter setting unit. The detection-difficulty determination unit calculates a degree of detection difficulty indicating a degree of difficulty in detection of a target cell contained in a specimen, based on a test object condition of the specimen. The detection-parameter setting unit sets a detection parameter for the detection of the target cell from a captured image of the specimen, based on the degree of detection difficulty.