The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2018
Filed:
Jul. 03, 2014
Leica Microsystems (Schweiz) Ag, Heerbrugg, CH;
Harald Schnitzler, Lüchingen, CH;
Leica Microsystems (Schweiz) AG, Heerbrugg, CH;
Abstract
A method () is proposed for furnishing a digital resulting image, using a microscope system () that comprises means (R, L,) for furnishing microscopic images at different numerical apertures as well as a digital image capture unit (). The method encompasses: capturing by means of the digital image capture unit (), in the form of digital individual images, at least two microscopic images at different numerical apertures; and comparing respective mutually corresponding image regions of the digital individual images to one another in terms of their image sharpness, the image regions of the digital individual images having the greatest image sharpness being in each case combined to yield the digital resulting image.