The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2018
Filed:
Oct. 01, 2015
Applicant:
Leica Microsystems (Schweiz) Ag, Heerbrugg, CH;
Inventors:
Harald Schnitzler, Lüchingen, CH;
Robert Paulus, Hergatz, DE;
Assignee:
Leica Microsystems (Schweiz) AG, Heerbrugg, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/02 (2006.01); G02B 21/08 (2006.01); G02B 21/12 (2006.01);
U.S. Cl.
CPC ...
G02B 21/006 (2013.01); G02B 21/0032 (2013.01); G02B 21/0044 (2013.01); G02B 21/02 (2013.01); G02B 21/025 (2013.01); G02B 21/082 (2013.01); G02B 21/125 (2013.01);
Abstract
A microscope () for detecting images of an object () located in an object plane () is described, comprising a microscope stand (); a microscope objective (); a light source () integrated into the microscope stand (); and a beam splitter (), integrated into the microscope objective (), for coupling in a coaxial incident illumination.