The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2018

Filed:

Dec. 15, 2015
Applicant:

Nuctech Company Limited, Beijing, CN;

Inventors:

Zhiqiang Chen, Beijing, CN;

Li Zhang, Beijing, CN;

Shuo Wang, Beijing, CN;

Yunda Sun, Beijing, CN;

Qingping Huang, Beijing, CN;

Zhi Tang, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 5/00 (2006.01); G01N 23/046 (2018.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G01V 5/005 (2013.01); G01N 23/046 (2013.01); G01V 5/0058 (2013.01); G06T 11/008 (2013.01); G01N 2223/401 (2013.01); G01N 2223/419 (2013.01); G01N 2223/643 (2013.01); G01V 5/0041 (2013.01);
Abstract

A method for positioning a target in a three-dimensional CT image and a security check system. The method includes: displaying a three-dimensional CT image; receiving a selection by a user of at least one area of the three-dimensional CT image at a first viewing angle to generate a first three-dimensional description; receiving a selection by the user of at least one area of the three-dimensional CT image at a second viewing angle to generate a second three-dimensional description, wherein an angle between the first viewing angle and the second viewing angle is within a predetermined range and the first three-dimensional description and the second three-dimensional description are related to a size, a location, and/or a physical property of a target at corresponding viewing angles; and determining the target in the three-dimensional CT image based on the first three-dimensional description and the second three-dimensional description.


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