The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2018

Filed:

Jan. 13, 2017
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Julia Traechtler, Karlsruhe, DE;

Qiu Wang, Princeton, NJ (US);

Boris Mailhe, Plainsboro, NJ (US);

Xiao Chen, Somerset, NJ (US);

Marcel Dominik Nickel, Herzogenaurach, DE;

Mariappan S. Nadar, Plainsboro, NJ (US);

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/561 (2006.01); G01R 33/48 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5612 (2013.01); G01R 33/4822 (2013.01);
Abstract

A method for magnetic resonance (MR) imaging is provided. A first sampling mask is provided for sampling along a first set of parallel lines extending in a first direction in k-space. A second sampling mask is provided for sampling along a second set of parallel lines extending in a second direction in k-space. The second direction is orthogonal to the first direction. A first set of MR k-space data is sampled using an MR scanner, by scanning a subject in the first direction using the first sampling mask. A second set of MR k-space data is sampled using the MR scanner, by scanning the subject in the second direction using the second sampling mask. An MR image is reconstructed from a combined set of MR k-space data including the first set of MR k-space data and the second set of MR k-space data.


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