The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2018

Filed:

Jan. 26, 2016
Applicant:

Duke University, Durham, NC (US);

Inventors:

Wolfgang Rehwald, Durham, NC (US);

Elizabeth Jenista, Durham, NC (US);

Raymond Kim, Durham, NC (US);

David Wendell, Durham, NC (US);

Assignee:

Duke University, Durham, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/56 (2006.01); G01R 33/567 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5602 (2013.01); G01R 33/5673 (2013.01);
Abstract

Magnetic resonance imaging (MRI) systems and methods for determining and adjusting TI using single-line acquisition and automatic compartment detection. A method includes positioning a readout line of the MRI scanner through a compartment of interest of a region of interest in a subject. The method includes inverting magnetization within the readout line by playing an inversion pulse; and reading out data along the readout line after play of the inversion pulse. The method also includes determining a T1 value for each pixel along the readout line; determining the pixels that belong to first and second portions within the compartment of interest; determining a T1 value of each of the first and second portions by averaging the pixels within each portion; and determining an inversion time based on the determined T1 values such that the compartment of interest has a desired magnetization in an image to be acquired.


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