The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2018

Filed:

Aug. 22, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Robert L. Franch, Wappingers Falls, NY (US);

Phillip J. Restle, Katonah, NY (US);

Thomas Strach, Wildberg, DE;

Christos Vezyrtzis, New York, NY (US);

Scott F. Warnock, Portland, OR (US);

Assignees:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2882 (2013.01);
Abstract

A method for increasing a resolution of an on-chip measurement circuit is provided. The method includes propagating a first signal through the on-chip measurement circuit to generate a first output. The method also includes propagating a second signal through the on-chip measurement circuit to generate a second output. The second signal includes a delay. The method also includes reconciling the first output and the second output to determine the resolution of the on-chip measurement circuit. The resolution of the on-chip measurement circuit increases in correspondence with a fineness of a step of the delay.


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