The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2018

Filed:

Apr. 19, 2016
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Friedrich Rasbornig, Klagenfurt, AT;

Mario Motz, Wernberg, AT;

Dirk Hammerschmidt, Villach, AT;

Ferdinand Gastinger, Woelfnitz, AT;

Bernhard Schaffer, Villach, AT;

Wolfgang Granig, Seeboden, AT;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01D 3/08 (2006.01); B60T 8/88 (2006.01); G01R 31/26 (2014.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/007 (2013.01); B60T 8/885 (2013.01); G01D 3/08 (2013.01); B60T 2250/06 (2013.01); B60T 2270/406 (2013.01); B60T 2270/411 (2013.01); B60T 2270/413 (2013.01); G01R 31/2644 (2013.01); G01R 31/2829 (2013.01); G01R 31/2856 (2013.01); G01R 31/2884 (2013.01);
Abstract

Embodiments relate to systems and methods for sensor self-diagnostics using multiple signal paths. In an embodiment, the sensors are magnetic field sensors, and the systems and/or methods are configured to meet or exceed relevant safety or other industry standards, such as SIL standards. For example, a monolithic integrated circuit sensor system implemented on a single semiconductor ship can include a first sensor device having a first signal path for a first sensor signal on a semiconductor chip; and a second sensor device having a second signal path for a second sensor signal on the semiconductor chip, the second signal path distinct from the first signal path, wherein a comparison of the first signal path signal and the second signal path signal provides a sensor system self-test.


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