The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2018
Filed:
Feb. 04, 2015
Applicant:
Omron Corporation, Kyoto-shi, Kyoto, JP;
Inventors:
Hiroshi Imai, Nara, JP;
Keiki Matsuura, Nara, JP;
Hiroyuki Tokusaki, Kasugai, JP;
Mao Ogimoto, Hirakata, JP;
Goro Kawakami, Kusatsu, JP;
Kohei Tomita, Kyoto, JP;
Atsuhiro Okamura, Kusatsu, JP;
Assignee:
OMRON CORPORATION, Kyoto-shi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 15/16 (2006.01); G01R 1/07 (2006.01);
U.S. Cl.
CPC ...
G01R 15/16 (2013.01); G01R 15/165 (2013.01); G01R 1/07 (2013.01);
Abstract
Provided is a non-contact voltage measuring device capable of measuring, with given accuracy, measurement target voltages applied to various conducting wires having respective different shapes. An inner electrode which is deformable depending on a shape of a wire 'w' is electrically connected, via a connecting section, to an outer electrode fixed to an electric field shield.