The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2018
Filed:
Nov. 05, 2015
University of Electronic Science and Technology of China, Chengdu, Sichuan, CN;
Feng Tan, Chengdu, CN;
Duyu Qiu, Chengdu, CN;
Peng Ye, Chengdu, CN;
Hao Zeng, Chengdu, CN;
Yong Zhao, Chengdu, CN;
Jun Jiang, Chengdu, CN;
Huiqing Pan, Chengdu, CN;
Lianping Guo, Chengdu, CN;
Shuhao Wu, Chengdu, CN;
UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA, Chengdu, CN;
Abstract
The present invention provides a method for a method for measuring the properties of liquid based on a quartz crystal microbalance sensor, which employs two measurements to obtain two frequency shifts of the QCM sensor induced by two different volume of the sample liquid. The present invention creatively established the relationship between the density and viscosity of sample liquid and the frequency shifts of QCM sensor. With present invention, the density and viscosity of sample liquid can be obtained through two frequency shifts. Comparing to the conventional liquid property measurement. The measuring procedure of present invention are more simple, and the measuring results are more accurate. Moreover, the present invention consumes less volume of sample liquid, and has the features such as online, real time and quantitative.