The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2018
Filed:
Jun. 28, 2016
Shimadzu Corporation, Kyoto-shi, Kyoto, JP;
Takao Marui, Sorakugun, JP;
SHIMADZU CORPORATION, Kyoto-shi, Kyoto, JP;
Abstract
The invention provides a sensitivity correction coefficient calculating system for an X-ray detector with which the sensitivity correction coefficient can be calculated using a multipurpose X-ray source instead of a specific X-ray source. In the sensitivity correction coefficient calculating system for an X-ray detector having a detection surface where detection elements for detection the X-ray intensity are aligned one-dimensionally or two-dimensionally, fitting is carried out on the measured X-ray intensity detected by a detection element using an approximation function so as to calculate the sensitivity correction coefficient using the calculated X-ray intensity calculated from the approximation function and the measured X-ray intensity.