The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2018
Filed:
Feb. 04, 2017
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Manfred Kuster, Widnau, CH;
George Themelis, Lindau, DE;
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Abstract
The invention relates to an illumination filter () for an illumination filter system () for medical imaging, in particular multispectral fluorescence imaging, as performed e.g. in a microscope () or endoscope, in particular a multispectral fluorescence microscope. The present invention provides an illumination filter for medical imaging, in particular a multispectral fluorescence imaging, that is capable of capturing simultaneously more than one fluorescence signal, and allow a homogeneous illumination for obtaining different images from the object illuminated by comprising a spatial filter pattern () masking a defined filtering fraction of a first illumination path () on the filter and masking a defined filtering fraction of a second illumination path () on the filter, wherein the filtering fraction of the first and the second illumination paths () are different. The invention further relates to an illumination filter system () for medical imaging, in particular multispectral fluorescence imaging, as performed e.g. in a microscope () or endoscope, in particular a multispectral fluorescence microscope, comprising such illumination filter ().