The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2018

Filed:

May. 31, 2017
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Hironori Nishino, Isehara, JP;

Yasuo Matsumiya, Hadano, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/00 (2006.01); G01J 5/60 (2006.01);
U.S. Cl.
CPC ...
G01J 5/0003 (2013.01); G01J 5/60 (2013.01); G01J 2005/0081 (2013.01);
Abstract

A heat source detection device includes a processor configured to calculate, as a single-wavelength temperature, one of a first temperature obtained by converting a first output output from the infrared sensor in accordance with an incident amount of infrared rays in a first infrared wavelength band into a temperature, a second temperature obtained by converting a second output from the infrared sensor in accordance with an incident amount of infrared rays in a second infrared wavelength band into a temperature and an average value of the first and second temperatures, and calculate a dual-wavelength temperature obtained by converting the ratio between the first and second outputs into a temperature; and to determine a temperature of the heat source based on the dual-wavelength temperature and determine a distance to the heat source from the infrared sensor based on a comparison result between the single-wavelength temperature and dual-wavelength temperature.


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