The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2018
Filed:
Oct. 03, 2016
Applicant:
Topcon Corporation, Itabashi-ku, JP;
Inventors:
Assignee:
TOPCON CORPORATION, Itabashi-ku, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/44 (2006.01); G01B 11/00 (2006.01);
U.S. Cl.
CPC ...
G01J 1/44 (2013.01); G01B 11/00 (2013.01);
Abstract
A technique for effectively detecting abnormal values in electromagnetic wave measurement is provided. An electromagnetic wave measuring device includes a measurement data receiving unit, an abnormal value detecting unit, and a GUI controlling unit. The measurement data receiving unitreceives measurement data of electromagnetic waves that are measured at multiple positions. The abnormal value detecting unitdetects an abnormal value in the measurement data. The GUI controlling unitdisplays a position at which the abnormal value is measured, on a display.