The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2018
Filed:
Mar. 11, 2016
Villanova University, Villanova, PA (US);
Qianhong Wu, Malvern, PA (US);
Kei-Peng Jen, Broomall, PA (US);
Rungun Nathan, Reading, PA (US);
Chris W. Townend, Media, PA (US);
Villanova University, Villanova, PA (US);
The Penn State Research Foundation, University Park, PA (US);
Abstract
An impact test system includes a head model having a head exterior component; a skull component; a brain component; a fluid component; an interior cavity surface; and a translucent cover, wherein the head model is coupled with a mount, the brain component and fluid components are configured within the interior cavity, and wherein the translucent cover is configured over a portion of the brain component and fluid component. A mount is configured to a least partially restrain the head model. A camera is configured to take a plurality of images of the brain and the fluid components through the translucent cover when the head model is under an impact force.