The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2018
Filed:
Jan. 24, 2017
Applicant:
Lithoptek Llc, Summit, NJ (US);
Inventors:
Mark Schattenburg, Framingham, MA (US);
Rudolf Hendel, Summit, NJ (US);
Paul Glenn, Wellesley, MA (US);
John Glenn, Carlisle, MA (US);
Assignee:
Lithoptek LLC, Summit, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/002 (2013.01);
Abstract
A method and apparatus in which retroreflective materials and surfaces are used for determining the position, orientation and scale of work pieces in order to accurately place process beams thereon for the purpose of surface patterning or treatment.
Schattenburg, Mark. (2018). Detection of position, orientation and scale of work pieces using retroreflective surfaces (U.S. Patent No. 10145672). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10145672
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile