The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2018
Filed:
Jun. 16, 2015
Agency for Science, Technology and Research, Singapore, SG;
Kabushiki Kaisha Topcon, Tokyo, JP;
Jun Cheng, Singapore, SG;
Jiang Liu, Singapore, SG;
Lixin Duan, Singapore, SG;
Yanwu Xu, Singapore, SG;
Wing Kee Damon Wong, Singapore, SG;
Masahiro Akiba, Tokyo, JP;
AGENCY FOR SCIENCE, TECHNOLOGY AND RESEARCH, Singapore, SG;
KABUSHIKI KAISHA TOPCON, Tokyo, JP;
Abstract
A method and system are proposed to obtain a reduced speckle noise image of a subject from optical coherence tomography (OCT) image data of the subject. The cross sectional images each comprise a plurality of scan lines obtained by measuring the time delay of light reflected, in a depth direction, from optical interfaces within the subject. The method comprises two aligning steps. First the cross sectional images are aligned, then image patches of the aligned cross sectional images are aligned to form a set of aligned patches. An image matrix is then formed from the aligned patches; and matrix completion is applied to the image matrix to obtain a reduced speckle noise image of the subject.