The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2018
Filed:
Dec. 05, 2012
Arcam Ab, Moelndal, SE;
Ulric Ljungblad, Moelndal, SE;
ARCAM AB, Moelndal, SE;
Abstract
A method for detecting defects in three-dimensional articles. Providing a model of said article. Providing a first powder layer on a substrate, directing an energy beam over said substrate causing said first powder layer to fuse in selected locations forming a first cross section of said three-dimensional article, providing a second powder layer on said substrate, directing the energy beam over said substrate causing said second powder layer to fuse in selected locations to form a second cross section of said three-dimensional article. A first and second image of a first and second fusion zone of said first powder layer respectively is captured. Comparing said first and second images with corresponding layers in said model. Detecting a defect in the three-dimensional article if a deviation in said first image with respect to said model is at least partially overlapping a deviation in said second image with respect to said model.