The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10143432 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 04, 2018

Filed:

Feb. 08, 2016
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Kye Yong Jeong, Suwon-si, KR;

Young Hun Sung, Hwaseong-si, KR;

Dong-Goo Kang, Hwaseong-si, KR;

Ji Young Choi, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G06K 9/52 (2006.01); G06T 5/00 (2006.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5205 (2013.01); A61B 6/4035 (2013.01); A61B 6/482 (2013.01); A61B 6/502 (2013.01); G06K 9/52 (2013.01); G06T 5/009 (2013.01); G06T 5/50 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/20016 (2013.01); G06T 2207/20221 (2013.01); G06T 2207/30004 (2013.01);
Abstract

An X-ray apparatus includes an image separator configured to separate an X-ray image of an object into material images representing materials in the object; a parameter determiner configured to determine a width of a material of interest (MOI) based on the material images, and determine an enhancement parameter configured to enhance contrast of the MOI according to the width of the MOI; and an image enhancer configured to separate the X-ray image into detailed images respectively including spatial frequencies of different frequency bands, enhance each of the detailed images according to the enhancement parameter, and synthesize the enhanced detailed images to generate an enhanced image.


Find Patent Forward Citations

Jeong, Kye. (2018). X-ray apparatus and control method for the same (U.S. Patent No. 10143432). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10143432

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