The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2018
Filed:
May. 10, 2017
Instrumentacion Y Oftalmologia Insoft S.l., Santa Cruz de Tenerife, ES;
Manuel Antonio Gonzalez de la Rosa, Santa Cruz de Tenerife, ES;
INSTRUMENTACION Y OFTALMOLOGIA INSOFT S.L., Santa Cruz de Tenerife, ES;
Abstract
This document discloses both a method for visual field examination that makes it possible to perform eye sensitivity examinations and an instrument that is configured to perform said method for visual field examination. The method is based on absolute conditions, i.e. absolute differences in the differential luminous thresholds between symmetrical points with respect to the vertical meridian or the horizontal meridian are used; in this way, unlike with already-known methods, it is possible to study the symmetry and/or the harmony of the subjects themselves, without having to compare them to a reference population with all that this entails.