The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2018

Filed:

Mar. 17, 2015
Applicant:

Jiangsu University, Jiangsu, CN;

Inventors:

Lizhang Xu, Jiangsu, CN;

Yaoming Li, Jiangsu, CN;

Zhenwei Liang, Jiangsu, CN;

Zhong Tang, Jiangsu, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A01D 41/127 (2006.01); A01F 12/44 (2006.01); A01F 12/46 (2006.01); A01F 12/48 (2006.01); A01F 12/56 (2006.01); H04N 5/372 (2011.01);
U.S. Cl.
CPC ...
A01D 41/1276 (2013.01); A01D 41/1277 (2013.01); A01F 12/444 (2013.01); A01F 12/448 (2013.01); A01F 12/46 (2013.01); A01F 12/48 (2013.01); A01F 12/56 (2013.01); H04N 5/372 (2013.01);
Abstract

A combine harvester self-adaptive cleaning control apparatus, includes a return plate, a cleaning sieve, a cleaning centrifugal blower, an impurity collection and stirring auger, a grain collection and stirring auger, a cleaning grain loss monitoring sensor, a grain tank grain impurity rate automatic monitoring apparatus, and an on-line monitoring and control system. The on-line monitoring and control system is connected to the cleaning centrifugal blower, the cleaning grain loss monitoring sensor, the grain tank grain impurity rate automatic monitoring apparatus, and a power driving mechanism of a louver sieve having an adjustable opening. Also disclosed is a self-adaptive cleaning method of the cleaning apparatus which can automatically adjust various working parameters according to a working quality of a working process, control failure rate, and improve a down-time working time for the apparatus.


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