The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2018

Filed:

Jul. 25, 2016
Applicant:

Oren Aharon, Haifa, IL;

Inventor:

Oren Aharon, Haifa, IL;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/00 (2006.01); H04N 17/00 (2006.01); G01M 11/02 (2006.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01); G01M 11/0207 (2013.01); G01M 11/0257 (2013.01);
Abstract

A unique electro optical design will be disclosed, implemented for MTF measurements of multiple optical elements. The measurements are performed over a wide field of view by collimators moving in parallel in a synchronized manner while maintaining accuracy. The movement is angular over a wide angle and in two perpendicular directions—pitch and yaw. By design, each said collimator element will perform its angular movement while protecting towards the center of lens under test from remote. Thus, the collimators' center of rotation will be the central point of each lens' input aperture. By shifting a tray loaded with lenses, a different batch will be tested on each sequence. The apparatus is suitable for testing both camera and lenses simultaneously. The apparatus will preferably test lenses or cameras directly on the production floor.


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