The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2018

Filed:

Aug. 07, 2017
Applicant:

Keysight Technologies, Inc., Minneapolis, MN (US);

Inventors:

Steven D. Draving, Colorado Springs, CO (US);

Christopher P. Duff, Colorado Springs, CO (US);

Assignee:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 1/20 (2006.01); G01R 29/027 (2006.01); H04L 25/03 (2006.01); G01R 29/26 (2006.01);
U.S. Cl.
CPC ...
H04L 1/205 (2013.01); G01R 29/0273 (2013.01); H04L 25/03146 (2013.01); G01R 29/26 (2013.01);
Abstract

Various illustrative embodiments pertain to a signal quality evaluation system having a decision feedback equalizer (DFE) and a signal quality evaluator. The DFE receives an input signal containing symbols that represent digital data and uses the symbols to generate multiple detection thresholds. Each detection threshold is one of several detection thresholds that can be generated by the DFE by processing one or more symbols present in the input signal prior to a current clock cycle of a clock that is recovered from the input signal. The signal quality evaluator uses the detection thresholds provided by the DFE to detect transitions in the input signal. The signal quality evaluator may execute jitter measurements and/or time interval error (TIE) measurements by evaluating the transitions in the input signal.


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