The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2018

Filed:

Aug. 12, 2010
Applicants:

Paul Carey, Mountain View, CA (US);

Aaron Muir Hunter, Santa Cruz, CA (US);

Dean Jennings, Beverly, MA (US);

Abhilash J. Mayur, Salinas, CA (US);

Stephen Moffatt, St. Lawrence, JE;

William Schaffer, Atascadero, CA (US);

Timothy N. Thomas, Portland, OR (US);

Mark Yam, Monte Sereno, CA (US);

Inventors:

Paul Carey, Mountain View, CA (US);

Aaron Muir Hunter, Santa Cruz, CA (US);

Dean Jennings, Beverly, MA (US);

Abhilash J. Mayur, Salinas, CA (US);

Stephen Moffatt, St. Lawrence, JE;

William Schaffer, Atascadero, CA (US);

Timothy N. Thomas, Portland, OR (US);

Mark Yam, Monte Sereno, CA (US);

Assignee:

APPLIED MATERIALS, INC., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/324 (2006.01); H01L 21/265 (2006.01); H01L 21/268 (2006.01); H01L 29/06 (2006.01); H01L 29/66 (2006.01); H01L 21/67 (2006.01); H01L 21/8234 (2006.01);
U.S. Cl.
CPC ...
H01L 21/26506 (2013.01); H01L 21/268 (2013.01); H01L 21/26513 (2013.01); H01L 21/324 (2013.01); H01L 29/0653 (2013.01); H01L 29/6659 (2013.01); H01L 29/66659 (2013.01); H01L 21/67115 (2013.01); H01L 21/823418 (2013.01);
Abstract

The present invention generally describes one ore more methods that are used to perform an annealing process on desired regions of a substrate. In one embodiment, an amount of energy is delivered to the surface of the substrate to preferentially melt certain desired regions of the substrate to remove unwanted damage created from prior processing steps (e.g., crystal damage from implant processes), more evenly distribute dopants in various regions of the substrate, and/or activate various regions of the substrate. The preferential melting processes will allow more uniform distribution of the dopants in the melted region, due to the increased diffusion rate and solubility of the dopant atoms in the molten region of the substrate. The creation of a melted region thus allows: 1) the dopant atoms to redistribute more uniformly, 2) defects created in prior processing steps to be removed, and 3) regions that have hyper-abrupt dopant concentrations to be formed.


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