The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2018
Filed:
May. 27, 2015
Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;
Kazuki Takahashi, Wako, JP;
Sayaka Suwa, Itabashi, JP;
Takehiko Nishimura, Kawasaki, JP;
Yoshihiko Nishida, Kawasaki, JP;
FUJITSU LIMITED, Kawasaki, JP;
Abstract
An abnormality detection system includes a processor configured to execute a process. The process includes: storing log data in a storage in which at least a production device number is associated with the event date and time; referring to the log data stored in the storage and calculating a temporal relationship between a first device and a second device that subsequently performs a process after the first device from among a plurality of production devices; detecting elapse of a reference time that is obtained from both the latest log data from among the pieces of log data related to the first device stored in the storage and the temporal relationship calculated at the calculating and that new log data related to the second device is not newly stored in the storage; and displaying an alarm when detection is obtained at the detecting.