The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2018

Filed:

Aug. 10, 2014
Applicant:

Palo Alto Research Center Incorporated, Palo Alto, CA (US);

Inventors:

Hoda Eldardiry, San Carlos, CA (US);

Sricharan Kallur Palli Kumar, Mountain View, CA (US);

Daniel H. Greene, Sunnyvale, CA (US);

Robert Price, Palo Alto, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06N 5/02 (2006.01); G06F 21/00 (2013.01); G06F 21/55 (2013.01); G06Q 50/00 (2012.01); H04L 29/06 (2006.01); G06N 99/00 (2010.01);
U.S. Cl.
CPC ...
G06N 5/025 (2013.01); G06F 21/00 (2013.01); G06F 21/552 (2013.01); G06Q 50/00 (2013.01); H04L 63/14 (2013.01); G06N 99/005 (2013.01);
Abstract

A computer-implemented system and method for detecting anomalies using sample-based rule identification is provided. Data for data is maintained analytics in a database. A set of anomaly rules is defined. A rare pattern in the data is statistically identified. The identified rare pattern is labeled as at least one of anomaly and non-anomaly based on verification by a domain expert. The set of anomaly rules is adjusted based on the labeled anomaly. Other anomalies in the data are detected and classified by applying the adjusted set of anomaly rules to the data.


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