The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2018
Filed:
Apr. 25, 2013
Layar B.v., Amsterdam, NL;
Klaus Michael Hofmann, Amsterdam, NL;
Dirk Groten, Amsterdam, NL;
Raimo Juhani Van Der Klein, Hoofddorp, NL;
LAYAR B.V., Amsterdam, NL;
Abstract
Method and systems for generating reference features sets for slices of a reference image. The reference features sets generated from slices enables better object recognition and/or tracking when a camera image only shows a portion of the reference image. Metadata is used to link the reference features set of the original image and of the slices together as belonging to the same object, providing hierarchical relationship information and/or spatial relationship information. An image processing function may be dynamically configured on the basis of whether an object has been successfully detected and the metadata associated with the object.