The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2018

Filed:

Aug. 31, 2015
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Subrahmanyam Venkata Rama Kommisetti, Singapore, SG;

Haw Jyue Luo, Hsinchu, TW;

Jimmy Iskandar, Fremont, CA (US);

Hsincheng Lai, Tainan, TW;

Parris Hawkins, Los Altos, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); H05B 37/03 (2006.01); G06F 7/556 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5009 (2013.01); G06F 7/556 (2013.01); H05B 37/03 (2013.01); G05B 23/024 (2013.01); G05B 23/0221 (2013.01); G05B 2219/37537 (2013.01); G06F 2207/556 (2013.01);
Abstract

Embodiments disclosed herein include methods for reducing or eliminating the impact of tuning disturbances during prediction of lamp failure. In one embodiment, the method comprises monitoring data of a lamp module for a process chamber using one or more physical sensors disposed at different locations within the lamp module, creating virtual sensors based on monitoring data of the lamp module, and providing a prediction model for the lamp module using the virtual sensors as inputs.


Find Patent Forward Citations

Loading…