The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2018

Filed:

May. 28, 2013
Applicants:

Dick Baardse, Geldermalsen, NL;

Feng Yu, Irvine, CA (US);

Hui Qin, Shanghai, CN;

Ying Lin, Yantai, CN;

Jinbiao Zhu, Shanghai, CN;

Inventors:

Dick Baardse, Geldermalsen, NL;

Feng Yu, Irvine, CA (US);

Hui Qin, Shanghai, CN;

Ying Lin, Yantai, CN;

Jinbiao Zhu, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/50 (2013.01);
Abstract

Methods for modifying geometric models and corresponding systems and computer-readable mediums. A method includes receiving a geometric model, the geometric model including a plurality of curves. The method includes receiving a selection of one or more curves of the plurality of curves, finding at least one other curve of the plurality of curves that is related to the selected curve, and finding relationships between the selected curve and the other curve(s), including adding the selected curve, the other curve(s), and the relationships to a selected curve set. The method includes pre-processing the selected curve set, including de-activating a set of constraints for the geometric model. The method includes receiving a modification of the selected curve and modifying the selected curve set to produce a modified geometric model and modified selected curve set. The method includes post-processing the modified selected curve set, including re-activating and applying constraints for the geometric model.


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