The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2018

Filed:

Aug. 23, 2013
Applicant:

Nec Corporation, Minato-ku, Tokyo, JP;

Inventors:

Masaaki Tsuchida, Tokyo, JP;

Kai Ishikawa, Tokyo, JP;

Takashi Onishi, Tokyo, JP;

Daniel Georg Andrade Silva, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 17/27 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30684 (2013.01); G06F 17/2705 (2013.01); G06F 17/30719 (2013.01);
Abstract

A text mining device () is used in which data composed of a set of records including an attribute value and text data is used as analysis target data. The text mining device () includes an analysis perspective candidate generation unit () that extracts an attribute value from the analysis target data and generates an analysis perspective candidate using the extracted attribute value, and a characteristic degree calculation unit () that compares text data in a record including the attribute value extracted as the analysis perspective candidate with text data in a record set that includes at least a record other than the record including the attribute value in the analysis target data, and calculates a characteristic degree indicating a relationship between the analysis perspective candidate and the analysis target data based on a result of the comparison.


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