The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2018

Filed:

Dec. 22, 2014
Applicant:

Teradata Us, Inc., Dayton, OH (US);

Inventors:

Congnan Luo, San Diego, CA (US);

Heng Yuan, San Diego, CA (US);

Daniel Wong, San Diego, CA (US);

Guilian Wang, San Diego, CA (US);

Assignee:

Teredata, US, Inc., Dayton, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30598 (2013.01); G06F 17/30339 (2013.01); G06F 17/30498 (2013.01);
Abstract

Relational data for a database table having multiple columns (dimensions) is represented as a histogram. The buckets of the histogram are clustered into clusters, the clusters are fewer in number than the buckets of the histogram. Each cluster is represented in hyper-space as a line segment (vector) with a thickness value. Average frequencies for the line segments (vectors) and their thickness values are computed. The average frequencies are processed by a query optimizer when processing a query predicate of a query to use as an estimation of selectivity or an estimation of a cardinality of a join operation.


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